ICMTS2019採択決定

以下の論文が国際会議 ICMTS 2019 (International Conference on Microelectronic Test Structures) に採択されました.

  • Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2019.
  • Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, “Study on statistical parameter extraction of power MOSFET model by principal component analysis,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2019.
カテゴリー: Conference/Workshop タグ: パーマリンク