IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences への以下の論文の採録が決定しました．
- Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato:
“Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter Based Importance Sampling,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, July 2016 (to appear). - Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
“Fast Estimation of NBTI-Induced Delay Degradation Based on Signal Probability,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, July 2016 (to appear).