以下の2件の論文が、2022年3月に開催される国際会議 34th IEEE International Conference on Microelectronic Test Structures 2022 に採択されました。
- Kyohei Shimozato and Takashi Sato, “dGPLVM: A nonparametric device model for statistical circuit simulation,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2022. (accepted for presentation)
- Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato, “Layout-dependent vertical and in-plane leakage current reduction of organic thin-film transistors by layer-contact restriction,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2022. (accepted for presentation)