Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019.
- Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, “Study on statistical parameter extraction of power MOSFET model by principal component analysis,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.107-112, March 2019.
- Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), pp.194-199, March 2019.
