Two papers have been accepted for presentation in ICMTS 2019 (International Conference on Microelectronic Test Structures).
- Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “A compact model of I-V characteristic degradation for organic thin film transistors,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2019.
- Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, “Study on statistical parameter extraction of power MOSFET model by principal component analysis,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2019.