2012年3月19日-21日に,アメリカ合衆国・カリフォルニア州Santa Clara,Techmart CenterにてISQED (The International Symposium on Quality Electronic Design) Symposium 2012 が開催され,佐藤が発表を行いました.
- Takashi Sato, Hiromitsu Awano, Hirofumi Shimizu, Hiroshi Tsutsui, and Hiroyuki Ochi, “Statistical Observations of NBTI-Induced Threshold Voltage Shifts on Small Channel-Area Devices,” in Proc. of International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), pp.306-311, Mar. 2012.