以下の論文が国際会議VMC2016 (Workshop on Variability Modeling and Characterization)に採択されました。
- Michihiro Shintani, Kazuki Oishi, Rui Zhou, Masayuki Hiromoto, and Takashi Sato:
“Unique Device Identification Framework for Power MOSFETs Using Inherent Device Variation,” in Proc. of IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) (Austin, TX), Nov. 2016 (to appear). - Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
“Representative Path Approach for Time-Efficient NBTI Mitigation Logic Replacement,” in Proc. of IEEE/ACM Workshop on Variability Modeling and Characterization (VMC) (Austin, TX), Nov. 2016 (to appear).