Journal of Electronic Testing: Theory and Applications (JETTA)への以下の論文の採録が決定しました．
- Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, and Takashi Sato:
“Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing,” Journal of Electronic Testing: Theory and Applications, Oct. 2016 (to appear).