以下の論文が国際会議GLSVLSI2016に採択されました。
- Song Bian, Michihiro Shintani, Shumpei Morita, Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato:
“Workload-Aware Worst Path Analysis of Processor-Scale NBTI Degradation,” Great Lakes Symposium on VLSI (GLSVLSI) (Boston, MA), May 2016 (to appear).