Following paper has been accepted for publication in Journal of Electronic Testing: Theory and Applications (JETTA).
- Michihiro Shintani, Takumi Uezono, Kazumi Hatayama, Kazuya Masu, and Takashi Sato:
“Path Clustering for Test Pattern Reduction of Variation-Aware Adaptive Path Delay Testing,” Journal of Electronic Testing: Theory and Applications, Oct. 2016 (to appear).