以下の論文のESSDERC2014 (the 2014 European Solid-State Device Research Conference)での発表が決定しています．
- Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato, “Variability in Device Degradations: Statistical Observation of NBTI for 3996 Transistors,” European Solid-State Device Research Conference (ESSDERC), accepted for presentation, 2014. (Venice, Italy)