Index
- Journal papers
- Conference or workshop papers (w/review)
- Workshop or convention (w/o review)
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Song Bian,
Dur E Shahwar Kundi,
Kazuma Hirozawa,
Weiqiang Liu, and
Takashi Sato:
"APAS: Application-Specific Accelerators for RLWE-Based Homomorphic Linear Transformations,"
IEEE Transactions on Information Forensics and Security, Vol.16, pp.4663-4678, Sep. 2021.
DOI: 10.1109/TIFS.2021.3114032
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Yasuhiro Ogasahara,
Kazunori Kuribara,
Kunihiro Oshima,
Zhaoxing Qin, and
Takashi Sato:
"Yield and Leakage Current of Organic Thin-Film Transistor Logic Gates Toward Reliable and Low-Power Operation of Large-Scale Logic Circuits for Iot Nodes,"
Japanese Journal of Applied Physics (JJAP), Dec. 2021.
DOI: 10.35848/1347-4065/ac44cf
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Michihiro Shintani,
Aoi Ueda, and
Takashi Sato:
"Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation,"
IEEE Transactions on Power Electronics, Vol.37, No.3, pp.2970-2980, Mar. 2022.
DOI: 10.1109/TPEL.2021.3118057
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Shumpei Morita,
Song Bian,
Michihiro Shintani, and
Takashi Sato:
"Efficient Analysis and Mitigation of Workload-Dependent Aging Degradation,"
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.XX, No.3, Mar. 2022.
DOI: 10.1109/TCAD.2022.3149856
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Zhaoxing Qin,
Kazunori Kuribara,
Yasuhiro Ogasahara, and
Takashi Sato:
"Hybrid CMOS and Pseudo-CMOS Organic Memory for Flexible Sensors,"
IEEE Sensors Journal, Mar. 2022.
DOI: 10.1109/JSEN.2022.3153714
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Takashi Sato,
Yuki Tanaka, and
Song Bian:
"Clonable PUF: On the Design of PUFs That Share Equivalent Responses,"
in Proc. of IEEE International Symposium on Circuits and Systems (ISCAS) (Daegu, Korea), May 2021.
DOI: 10.1109/ISCAS51556.2021.9401345
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Tatsuki Ono,
Song Bian, and
Takashi Sato:
"Automatic Parallelism Tuning for Module Learning with Errors Based Post-Quantum Key Exchanges on GPUs,"
in Proc. of IEEE International Symposium on Circuits and Systems (ISCAS) (Daegu, Korea), May 2021.
DOI: 10.1109/ISCAS51556.2021.9401575
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Zhaoxing Qin,
Kazunori Kuribara, and
Takashi Sato:
"An SRAM-Based Scratchpad Memory for Organic Iot Sensors,"
in Proc. of IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) (Virtual, online), pp.1-4, June 2021.
DOI: 10.1109/FLEPS51544.2021.9469833
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Itsuki Shirakami and Takashi Sato:
"Extraction of Heart Rate Variability Using Commodity Wi-Fi Devices,"
in Proc. of IEEE International Conference on Biomedical and Health Informatics (BHI) (Virtual, online), pp.1-4, July 2021.
DOI: 10.1109/BHI50953.2021.9508523
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Song Bian,
Weiwen Jiang, and
Takashi Sato:
"Privacy-Preserving Medical Image Segmentation via Hybrid Trusted Execution Environment,"
ACM/IEEE Design Automation Conference (DAC) (San Francisco, USA), pp.1347-1350, July 2021.
DOI: 10.1109/DAC18074.2021.9586198
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Kotaro Matsuoka,
Ryotaro Banno,
Naoki Matsumoto,
Takashi Sato, and
Song Bian:
"Virtual Secure Platform: A Five-Stage Pipeline Processor Over TFHE,"
USENIX Security Symposium (Virtual (was Vancouver, Canada)), Aug. 2021.
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Hiroki Tsukamoto,
Song Bian, and
Takashi Sato:
"Statistical Device Modeling with Arbitrary Model-Parameter Distribution via Markov Chain Monte Carlo ,"
in Proc. of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (Dallas, TX), pp.1-4, Sep. 2021.
DOI: 10.1109/SISPAD54002.2021.9592558
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Kyohei Shimozato,
Yohei Nakamura, and
Takashi Sato:
"Analysis of Thermal Concentration Failure in Unclamped Inductive Switching Based on Three-Dimensional Electro-Thermal Simulation with On-Chip Variation,"
in Proc. of International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (Dallas, TX), pp.1-4, Sep. 2021.
DOI: 10.1109/SISPAD54002.2021.9592550
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Yasuhiro Ogasahara,
Kazunori Kuribara,
Kunihiro Oshima, and
Takashi Sato:
"Rail-to-Rail Output Voltage Swing of Inverter with Organic Thin-Film Transistor At 2.5V Vdd Toward Reliable Operation of Low Leakage Large Scale Logic Circuits,"
in Proc. of International Conference on Solid Devices and Materials (SSDM) (Virtual, online), pp.708-709, Sep. 2021.
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Yohei Nakamura,
Naotaka Kuroda,
Ken Nakahara,
Michihiro Shintani, and
Takashi Sato:
"Experimental Validation of Thermal Couple Impedance Model for Accurate Die Temperature Estimation in Power Modules,"
in Proc. of International Conference on Solid Devices and Materials (SSDM) (Virtual, online), pp.209-210, Sep. 2021.
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Suraj Hebbar and Takashi Sato:
"Motion Robust Remote Photoplethysmography via Frequency Domain Motion Artifact Reduction,"
in Proc. of Biomedical Circuits and Systems Conference (BioCAS) (Virtual, online), pp.1-4, Oct. 2021.
DOI: 10.1109/BioCAS49922.2021.9644650
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Yohei Nakamura,
Michihiro Shintani, and
Takashi Sato:
"Sensitivity Analysis of Device Parameter Variation on Current Imbalance of Parallel Connected SiC Power MOSFETs,"
in Proc. IEEE Energy Conversion Congress and Expo (ECCE) (Vancouver, Canada/Online), pp.5622-5628, Oct. 2021.
DOI: 10.1109/ECCE47101.2021.9595345
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Kotaro Matsuoka,
Yusuke Hoshizuki,
Takashi Sato, and
Song Bian:
"Towards Better Standard Cell Library: Optimizing Compound Logic Gates for TFHE,"
in Proc. ACM 9th Workshop on Encrypted Computing & Applied Homomorphic Cryptography (WAHC) (Seoul, South Korea/online), pp.63-68, Nov. 2021.
DOI: 10.1145/3474366.3486927
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Takashi Sato,
Hiromitsu Awano,
Sota Kondo, and
Koji Yamamoto:
"Respiratory Rate Estimation Based on Wifi Frame Capture,"
in Proc. IEEE consumer communications & networking conference (CCNC) (Virtual, Online), Jan. 2022.
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Kunihiro Oshima,
Kazunori Kuribara, and
Takashi Sato:
"Investigation of Layout-Dependent Characteristic Change for Improving Performance of Organic Thin-Film Transistors,"
in Proc. of International Conference on Microelectronic Test Structures (ICMTS) (Hybrid (Cleveland, OH)), Mar. 2022.
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Kyohei Shimozato,
Michihiro Shintani, and
Takashi Sato:
"Adaptive Outlier Detection for Power MOSFETs Based on Gaussian Process Regression,"
in Proc. IEEE Applied Power Electronics Conference & Exposition (APEC) (Houston, TX), Mar. 2022.
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Kyohei Shimozato and Takashi Sato:
"DGPLVM: A Nonparametric Device Model for Statistical Circuit Simulation,"
in Proc. of International Conference on Microelectronic Test Structures (ICMTS) (Hybrid (Cleveland, OH)), Mar. 2022.
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Masato Shiozaki and Takashi Sato:
"Characteristic Degradation of Power MOSFETs by X-Ray Irradiation and its Recovery,"
IEEE International Reliability Physics Symposium (IRPS) (Dallas, TX), Mar. 2022.
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Takashi Sato,
Hiroki Tsukamoto,
Song Bian, and
Michihiro Shintani:
"Acceleration of Current-Threshold Determination Toward On-Line IDDQ Testing Through Parameter Estimation,"
IEICE Technical Report, pp.7-12, Nov. 2021 (in Japanese).
generated at 2022/07/21 15:06:42