Index
- Journal papers
- Conference or workshop papers (w/review)
- Workshop or convention (w/o review)
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Ryusuke Miyamoto,
Hiroki Sugano,
Hiroyuki Ochi, and
Yukihiro Nakamura:
"Hardware Accelerator for Robust Object Tracking Using a Cascade Particle Filter,"
Journal of Signal Processing, Vol.15, No.3, pp.215-223, May 2011.
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Tetsuro Miyakawa,
Koh Yamanaga,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"Acceleration of Random-Walk-Based Linear Circuit Analysis Using Importance Sampling,"
in Proc. of GLSVLSI 2011 (Lausanne, Switzerland), pp.211-216, May 2011.
DOI: 10.1145/1973009.1973051
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Takashi Sato,
Tadamichi Kozaki,
Takumi Uezono,
Hiroshi Tsutsui, and
Hiroyuki Ochi:
"A Stress-Parallelized Device Array for Efficient Bias-Temperature Stability Measurement,"
in Proc. of IEEE International Workshop on Design for Manufacturability and Yield 2011 (DFM&Y) (San Diego Convention Center, San Diego, California, USA), pp.19-22, June 2011.
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Takashi Imagawa,
Hiroshi Yuasa,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"An Optimization Method of Selective TMR for Coarse-Grained Reconfigurable Architecutres Using Reliability Model of Routing Resources,"
in Proc. of IPSJ DA Symposium 2011, Aug. 2011 (in Japanese).
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Junya Kawashima,
Hiroyuki Ochi,
Hiroshi Tsutsui, and
Takashi Sato:
"A Design Strategy for Subthreshold Circuits Considering Energy-Minimization and Yield-Maximization,"
in Proc. of Workshop on Circuits and Systems, pp.401-406, Aug. 2011 (in Japanese).
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Kentaro Katayama,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"Sequential Importance Sampling for Yield Estimation of Circuits with Multiple Failure Regions,"
in Proc. of IPSJ DA Symposium 2011, Aug. 2011 (in Japanese).
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Junya Kawashima,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"A Design Strategy for Sub-Threshold Circuits Considering Energy-Minimization and Yield-Maximization,"
in Proc. of IEEE International SOC Conference (SOCC) (Taipei, Taiwan), pp.57-62, Sep. 2011. [IEEE Kansai Section Student Paper Award]
DOI: 10.1109/SOCC.2011.6085076
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Takashi Sato,
Tadamichi Kozaki,
Takumi Uezono,
Hiroshi Tsutsui, and
Hiroyuki Ochi:
"A Device Array for Efficient Bias-Temperature Instability Measurements,"
in Proc. of European Solid-State Device Research Conference (ESSDERC) (Finlandia Hall, Helsinki, Finland), pp.143-146, Sep. 2011.
DOI: 10.1109/ESSDERC.2011.6044214
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Jyothi Bhaskarr Velamala,
Takashi Sato, and
Yu Cao:
"Statistical Aging Prediction and Characterization Using Trapping/detrapping Based NBTI Models,"
in Proc. of Workshop on Variability Modeling and Characterization (VMC) (San Jose, CA), p.11, Nov. 2011.
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Michihiro Shintani and Takashi Sato:
"Getting the Most Out of IDDQ Testing,"
in Proc. of Workshop on Variability Modeling and Characterization (VMC) (San Jose, CA), p.8, Nov. 2011.
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Hiroshi Yuasa,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"Acceleration Scheme for Monte Carlo Based SSTA Using Generalized STA Processing Element,"
in Proc. of ACM/IEEE International Workshop on Timing Issues (TAU) (Taipei, Taiwan), Jan. 2012.
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Hiroshi Yuasa,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"Hardware Architecture for Accelerating Monte Carlo Based SSTA Using Generalized STA Processing Element,"
in Proc. of the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012) (B-con Plaza, Beppu, Oita, Japan), pp.205-210, Mar. 2012.
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Takashi Imagawa,
Takahiro Oue,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"GPU Acceleration of Cycle-Based Soft-Error Simulation for Reconfigurable Array Architectures,"
in Proc. of the 17th Workshop on Synthesis And System Integration of Mixed Information technologies (SASIMI2012) (B-con Plaza, Beppu, Oita, Japan), pp.88-93, Mar. 2012.
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Takashi Sato,
Hiromitsu Awano,
Hirofumi Shimizu,
Hiroshi Tsutsui, and
Hiroyuki Ochi:
"Statistical Observations of NBTI-Induced Threshold Voltage Shifts on Small Channel-Area Devices,"
in Proc. of International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), pp.306-311, Mar. 2012.
DOI: 10.1109/ISQED.2012.6187510
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Satoshi Yoshikawa,
Hiroshi Tsutsui,
Hiroyuki Okuhata, and
Takao Onoye:
"An Approach to Halo Suppression for Retinex-Based Image Enhancement,"
IEICE Technical Report, Vol.111, No.78, SIS2011-18, pp.93-98, June 2011 (in Japanese).
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Tatsuo Maeno,
Hiroshi Tsutsui, and
Takao Onoye:
"Quality Evaluation of an Inpainting-Based Deinterlacing Scheme,"
IEICE Technical Report, Vol.111, No.78, SIS2011-19, pp.99-104, June 2011 (in Japanese).
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Tsuyoshi Sakata,
Yasufumi Nariki,
Takaaki Okumura,
Toshiki Kanamoto,
Hiroo Masuda,
Takashi Sato,
Masanori Hashimoto,
Katsuhiro Furukawa,
Masakazu Tanaka, and
Toshiki Yamanaka:
"Variability Analysis of Delay Degradation on CMOS Driver Circuit Due to NBTI Effect,"
in Proc. of IPSJ DA Symposium 2011, pp.195-200, Aug. 2011 (in Japanese).
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Zhi Li,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"A Sensor-Based Self-Adjustment Approach for Controlling I/O Buffer Impedance,"
in Proc. of IEICE Society Conference (Sapporo, Japan), C-12-45, p.120, Sep. 2011.
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Takumi Morishita,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"A GPU Implementation of Jacobi Method for Power Grid Analysis,"
IEICE Society Conference, A-3-10, p.84, Sep. 2011 (in Japanese).
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Hirofumi Shimizu,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"An Automated Estimation of MOS Transistors' Interface-State Numbers Using EM Algorithm,"
IEICE Society Conference, C-12-18, p.93, Sep. 2011 (in Japanese).
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Hiromitsu Awano,
Hirofumi Shimizu,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"A Study on Parameter Estimation for Modeling of Random-Telegraph Noise,"
IEICE Technical Report, Vol.111, No.324, VLD2011-66, DC2011-42, pp.85-90, Nov. 2011 (in Japanese).
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Tetsuro Miyakawa,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"Random-Walk Based Transient Analysis for Linear Circuits Using Quasi-Zero-Variance Importance Sampling,"
IEICE Technical Report, Vol.111, No.324, VLD2011-64, DC2011-40, pp.73-78, Nov. 2011 (in Japanese).
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Takumi Morishita,
Hiroshi Tsutsui,
Hiroyuki Ochi, and
Takashi Sato:
"An Acceleration Method for Power Grid Analysis Using Block-Iterative Algorithm,"
IEICE Technical Report, Vol.111, No.324, VLD2011-63, DC2011-39, pp.67-71, Nov. 2011 (in Japanese).
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Michihiro Shintani and Takashi Sato:
"An Approach for Adaptive Determination of IDDQ Testing Criteria Based on Process Parameter Estimation,"
IEICE Technical Report, pp.49-54, Feb. 2012 (in Japanese).
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Koh Yamanaga and Takashi Sato:
"Combinatorial Use of Low and High-Series Resistance Capacitors for Reducing Impedance of Power Supply Network,"
Japan Institute of Electronics Packaging, Mar. 2012 (in Japanese).
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Michihiro Shintani and Takashi Sato:
"Global Process Parameter Estimation Using IDDQ Current Signature,"
IEICE Technical Report, pp.1-6, Mar. 2012 (in Japanese).
generated at 2022/07/21 15:05:32