Tag Archives: VMC

VMC2017

Posted on Monday November 20th, 2017 by ts

Sorry, this entry is only available in 日本語.

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VMC2013

Posted on Friday November 29th, 2013 by ts

On Nov. 21, Mr. Awano presented his recent work on long term reliability of VLSI circuits at VMC2013 held in San Jose. Bias temperature instability (BTI) is considered to have significant impact on long term reliability of VLSI.  At the … Continue reading →

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