Tag Archives: TVLSI

Paper published in IEEE Trans. VLSI

Posted on Tuesday August 1st, 2017 by ts

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Paper accepted for publication in IEEE Transactions on Very Large Scale Integration Systems

Posted on Thursday January 5th, 2017 by ts

The following paper has been accepted for publication in IEEE Transactions on Very Large Scale Integration Systems (TVLSI). Hiromitsu Awano, Shumpei Morita, and Takashi Sato: “Scalable device array for statistical characterization of BTI-related parameters,” IEEE Transactions on Very Large Scale … Continue reading →

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