Tag Archives: statistical simulation

Paper accepted: IEEE Transactions on Power Electronics

The following paper has been accepted for publication in IEEE Transactions on Power Electronics (TPEL). Michihiro Shintani, Aoi Ueda, and Takashi Sato, “Accelerating Parameter Extraction of Power MOSFET Models Using Automatic Differentiation,” IEEE Transactions on Power Electronics (TPEL), (accepted for … Continue reading

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Invited talk on statistical circuit simulation

On November 11 and 12, 2021, Prof. Sato gave the following invited talk on statistical circuit simulation at a workshop jointly organized by the Silicon Materials and Devices (SDM) Society of the Institute of Electronics, Information and Communication Engineers (IEICE) … Continue reading

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Paper accepted for presentation in SISPAD 2021

The following two papers have been accepted for presentation at the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2021. Kyohei Shimozato, Yohei Nakamura, and Takashi Sato, “Analysis of thermal concentration failure in unclamped inductive switching based on … Continue reading

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