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February 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 Archives
Tag Archives: reliability
ICMTS2019
Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading
Posted in Conference/Workshop
Tagged device model, ICMTS, IEEE, organic, power electronics, reliability
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(日本語) 2018年 電子情報通信学会 ソサイエティ大会
Posted in Conference/Workshop, Publication
Tagged IEICE, puf, reliability, security
Comments Off on (日本語) 2018年 電子情報通信学会 ソサイエティ大会