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December 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Tag Archives: reliability
(日本語) JJAPへの論文採録決定
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged device characterization, organic transistors, reliability
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(日本語) SSDM2022
对不起,此内容只适用于English和日本語。
(日本語) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 掲載決定
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability
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(日本語) SISPAD 2021採録決定
对不起,此内容只适用于English和日本語。
Posted in Conference/Workshop
Tagged device model, electro-thermal simulation, power device, reliability, statistical simulation
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Paper accepted for publication in Japanese Journal of Applied Physics
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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SSDM2020
Posted in Conference/Workshop
Tagged JSAP, MOSFET model, organic, power electronics, reliability, SSDM
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(日本語) Japanese Journal of Applied Physicsへの論文採録決定
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged device model, Journal, JSAP, organic, reliability
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(日本語) SASIMI2019
Posted in Conference/Workshop
Tagged novel computation, reliability, SASIMI, security
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(日本語) SSDM2019採択決定
对不起,此内容只适用于English和日本語。
Posted in Conference/Workshop
Tagged device model, JSAP, organic, reliability, SSDM
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