Tag Archives: reliability

Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading

Posted in Publication | Tagged , , , , , | Comments Off on Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Paper accepted for presentation in SISPAD 2021

The following two papers have been accepted for presentation at the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2021. Kyohei Shimozato, Yohei Nakamura, and Takashi Sato, “Analysis of thermal concentration failure in unclamped inductive switching based on … Continue reading

Posted in Conference/Workshop | Tagged , , , , | Comments Off on Paper accepted for presentation in SISPAD 2021

Paper accepted for publication in Japanese Journal of Applied Physics

We are pleased to announce that the following two papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). Oshima’s paper is a joint work with AIST. Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato, “An … Continue reading

Posted in Publication | Tagged , , , , , | Comments Off on Paper accepted for publication in Japanese Journal of Applied Physics

SSDM2020

Shimosato (M1), Qin (D1), and Oshima (M2) presented their papers at SSDM2020 (International Conference on Solid State Devices and Materials 2020) held on September 27-30, 2020 (Qin on 29th, Oshima on 29th, Shimosato on 30th). Shimosato’s presentation was about the … Continue reading

Posted in Conference/Workshop | Tagged , , , , , | Comments Off on SSDM2020

DA symposium

Posted in Conference/Workshop | Tagged , , | Comments Off on DA symposium

Japanese Journal of Applied Physics: paper accepted

The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading

Posted in Publication | Tagged , , , , | Comments Off on Japanese Journal of Applied Physics: paper accepted

SASIMI2019

Posted in Conference/Workshop | Tagged , , , | Comments Off on SASIMI2019

SSDM 2019: paper accepted

The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading

Posted in Conference/Workshop | Tagged , , , , | Comments Off on SSDM 2019: paper accepted

ICMTS2019

Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading

Posted in Conference/Workshop | Tagged , , , , , | Comments Off on ICMTS2019

(日本語) 2018年 電子情報通信学会 ソサイエティ大会

Posted in Conference/Workshop, Publication | Tagged , , , | Comments Off on (日本語) 2018年 電子情報通信学会 ソサイエティ大会