Tag Archives: reliability

Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Posted on Thursday February 10th, 2022 by ts

The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading →

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Paper accepted for presentation in SISPAD 2021

Posted on Wednesday June 23rd, 2021 by ts

The following two papers have been accepted for presentation at the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2021. Kyohei Shimozato, Yohei Nakamura, and Takashi Sato, “Analysis of thermal concentration failure in unclamped inductive switching based on … Continue reading →

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Paper accepted for publication in Japanese Journal of Applied Physics

Posted on Friday January 22nd, 2021 by ts

We are pleased to announce that the following two papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). Oshima’s paper is a joint work with AIST. Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato, “An … Continue reading →

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SSDM2020

Posted on Thursday October 29th, 2020 by ts

Shimosato (M1), Qin (D1), and Oshima (M2) presented their papers at SSDM2020 (International Conference on Solid State Devices and Materials 2020) held on September 27-30, 2020 (Qin on 29th, Oshima on 29th, Shimosato on 30th). Shimosato’s presentation was about the … Continue reading →

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DA symposium

Posted on Friday September 11th, 2020 by ts
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Japanese Journal of Applied Physics: paper accepted

Posted on Friday December 6th, 2019 by ts

The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading →

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SASIMI2019

Posted on Tuesday November 19th, 2019 by ts
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SSDM 2019: paper accepted

Posted on Thursday June 27th, 2019 by ts

The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading →

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ICMTS2019

Posted on Tuesday April 2nd, 2019 by ts

Two students, Tsukamoto and Saito, presented papers in the 32nd IEEE International Conference on Microelectronic Test Structure (ICMTS) 2019, at the International conference center in Kitakyushu, which was held during March 18-21, 2019. Hiroki Tsukamoto, Michihiro Shintani, and Takashi Sato, … Continue reading →

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(日本語) 2018年 電子情報通信学会 ソサイエティ大会

Posted on Friday September 21st, 2018 by ts
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