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December 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Tag Archives: power device
Paper accepted: EPE2022
The following paper has been accepted for presentation at the EPE 2022 ECCE Europe conference (EPE) 2022, an international conference related to power electronics to be held in September 2022. This is the result of joint research with Nara Institute … Continue reading
Posted in Conference/Workshop
Tagged capacitance characterization, device modeling, power device
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Paper accepted for presentation in IRPS2022
The following paper has been accepted for presentation in IRPS2022 (IEEE International Reliability Physics Symposium 2022). Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), … Continue reading
Posted in Conference/Workshop
Tagged device modeling, power device, X-ray irradiation
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Paper accepted for presentation in SISPAD 2021
The following two papers have been accepted for presentation at the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2021. Kyohei Shimozato, Yohei Nakamura, and Takashi Sato, “Analysis of thermal concentration failure in unclamped inductive switching based on … Continue reading
Posted in Conference/Workshop
Tagged device model, electro-thermal simulation, power device, reliability, statistical simulation
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Paper accepted for publication in Japanese Journal of Applied Physics
We are pleased to announce that the following two papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). Oshima’s paper is a joint work with AIST. Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato, “An … Continue reading
Posted in Publication
Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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