Language
Tags
- ACM
- ASP-DAC
- Award
- BBQ
- DAC
- DAS
- DATE
- design
- device model
- device modeling
- Event
- GLSVLSI
- heart rate
- homomorphic encryption
- ICCAD
- IEE
- IEEE
- IEICE
- IPSJ
- ISCAS
- ISQED
- Journal
- JSAP
- KWS
- Neural network
- novel computation
- organic
- organic circuit
- Party
- power device
- power electronics
- puf
- reliability
- RPPG
- SASIMI
- secure inference
- security
- SSDM
- statistical simulation
- Synthesis
- vital sensing
- VLD
- 研究会
- 研究室見学
- 野球大会
-
Recent Posts
Categories
Kyoto University
Static links
Meta
October 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Tag Archives: organic
IEEE Kansai Chapter MFSK Award
Oshima (M2) received the IEEE Kansai Chapter MFSK Award at the 20th IEEE Kansai Colloquium on Electronic Devices held online on November 27. The awarded presentation is as follows. Experimental study of bias stress degradation of organic thin filmtransistors [SSDM], … Continue reading
Posted in Award
Tagged device model, electron device society, IEEE, organic
Comments Off on IEEE Kansai Chapter MFSK Award
SSDM2020
Shimosato (M1), Qin (D1), and Oshima (M2) presented their papers at SSDM2020 (International Conference on Solid State Devices and Materials 2020) held on September 27-30, 2020 (Qin on 29th, Oshima on 29th, Shimosato on 30th). Shimosato’s presentation was about the … Continue reading
Posted in Conference/Workshop
Tagged JSAP, MOSFET model, organic, power electronics, reliability, SSDM
Comments Off on SSDM2020
Award: IPSJ Computer Science Research Award for Young Scientists
Mr. Oshima (M2) received the “Information Processing Society of Japan Computer Science Field Encouragement Award”. This award is given to a young researcher who has given an outstanding presentation at a meeting or a symposium of the computer science area … Continue reading
IEEE Transactions on Semiconductor Manufacturing: paper accepted
The following paper has been accepted for publication in the journal IEEE Transactions on Semiconductor Manufacturing. Organic thin-film transistors (OTFTs) have advantages such as low cost manufacturing on flexible substrates. Meanwhile, it is known that their characteristics are degraded when … Continue reading
Posted in Publication
Tagged device model, IEEE, Journal, organic
Comments Off on IEEE Transactions on Semiconductor Manufacturing: paper accepted
Japanese Journal of Applied Physics: paper accepted
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading
Posted in Publication
Tagged device model, Journal, JSAP, organic, reliability
Comments Off on Japanese Journal of Applied Physics: paper accepted
DA symposium 2019
Posted in Conference/Workshop
Tagged DAS, device model, IPSJ, organic
Comments Off on DA symposium 2019
FLEPS2019
Qin, M2, presented his research in IEEE International Conference on Flexible and Printable Sensors and Systems (FLEPS) 2019 held in Glasgow, UK on July 7-9, 2019 (Presentation date: 9th). Qin’s presentation is on the design of organic transistor-based PUF circuits, … Continue reading
SSDM 2019: paper accepted
The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading
Posted in Conference/Workshop
Tagged device model, JSAP, organic, reliability, SSDM
Comments Off on SSDM 2019: paper accepted