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April 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 Archives
Tag Archives: JSAP
Paper accepted for publication in Japanese Journal of Applied Physics
We are pleased to announce that the following two papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). Oshima’s paper is a joint work with AIST. Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato, “An … Continue reading
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Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work has been done in collaboration with AIST. Zhaoxing Qin, Song Bian, Kazunori Kuribara and Takashi Sato: “Stable organic SRAM cell with p-type access … Continue reading
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Tagged Journal, JSAP, organic circuit, SRAM
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SSDM2020
Shimosato (M1), Qin (D1), and Oshima (M2) presented their papers at SSDM2020 (International Conference on Solid State Devices and Materials 2020) held on September 27-30, 2020 (Qin on 29th, Oshima on 29th, Shimosato on 30th). Shimosato’s presentation was about the … Continue reading
Posted in Conference/Workshop
Tagged JSAP, MOSFET model, organic, power electronics, reliability, SSDM
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Japanese Journal of Applied Physics: paper accepted
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading
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Tagged device model, Journal, JSAP, organic, reliability
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SSDM 2019: paper accepted
The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019. Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation … Continue reading
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Tagged device model, JSAP, organic, reliability, SSDM
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Paper Published on Japanese Journal of Applied Physics (JJAP)
Sorry, this entry is only available in 日本語.
Posted in Publication
Tagged JSAP, organic
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(日本語) SSDM2017
Sorry, this entry is only available in 日本語.
SSDM 2017: paper accepted
The following paper has been accepted for oral presentation in International Conference on Solid State Devices and Materials (SSDM), which will be held during September 19-22, 2017. Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, Masayuki Hiromoto, and Takashi Sato: “A Design-Analysis … Continue reading
SSDM2016
Dr. Shintani presented his paper at International Conference on Solid State Devices and Materials (SSDM) held in Tsukuba, Japan. Dr. Shintani’s talk was about a circuit simulation model for SiC power MOSFET. Circuit simulation models standarized in the industry assume … Continue reading
SSDM 2016: paper accepted
The following paper has been accepted for presentation in International Conference on Solid State Devices and Materials (SSDM), which will be held during September 26-29, 2016. Michihiro Shintani, Yohei Nakamura, Masayuki Hiromoto, Takashi Hikihara, and Takashi Sato: “A Surface-Potential-Based Reverse-Transfer … Continue reading