Tag Archives: Journal

Student papers accepted for publication in IEICE journal

Posted on Saturday March 5th, 2016 by hiromoto

Following papers written by students (D3 and M1) have been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato: “Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter … Continue reading →

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(日本語) IEICE Transactions on Electronicsへの論文採録決定

Posted on Wednesday March 25th, 2015 by hiromoto

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Paper Published on IEEE Transactions on Device and Materials Reliability

Posted on Thursday September 18th, 2014 by admin

The following article has been published on IEEE Transactions on Device and Materials Reliability. Hiromitsu Awano, Masayuki Hiromoto and Takashi Sato, “BTIarray: A Time-overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability,” IEEE Transactions on Device and Materials … Continue reading →

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Paper Published on IEICE Transactions on Information an Systems

Posted on Tuesday August 12th, 2014 by ts

The following paper has been published on IEICE Transactions on Information and Systems. IDDQ test is a way of measuring manufacturing faults in chips by measuring the leakage current while the chip is in its quiescent state (i.e., when all … Continue reading →

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(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定

Posted on Monday August 11th, 2014 by hiromoto

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A paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability

Posted on Wednesday May 21st, 2014 by admin

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A paper has been accepted for publication in IEICE Transactions

Posted on Monday April 28th, 2014 by ts

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(日本語) IEICE Transactions on Electronics への論文掲載

Posted on Tuesday April 22nd, 2014 by ts

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A paper has been accepted for publication in IEEE Transactions on Device and Materials Reliability

Posted on Monday March 3rd, 2014 by ts

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Our paper has been accepted for publication in IEEE Trans. on CAD

Posted on Tuesday January 21st, 2014 by ts

The following paper has been accepted for publication in IEICE Transactions on Electronics. Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” to appear in … Continue reading →

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