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December 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Tag Archives: Journal
(日本語) IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 掲載決定
对不起,此内容只适用于English和日本語。
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Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
对不起,此内容只适用于English和日本語。
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Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged Journal, JSAP, organic circuit, SRAM
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IEEE Transactions on Semiconductor Manufacturing: paper accepted
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Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
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Tagged IEEE, Journal, puf, security
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
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Tagged device model, IEEE, Journal, power electronics
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(日本語) Japanese Journal of Applied Physicsへの論文採録決定
对不起,此内容只适用于English和日本語。
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Tagged device model, Journal, JSAP, organic, reliability
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(日本語) Japanese Journal of Applied Physicsへの論文採録決定
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged Journal, organic, puf
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(日本語) IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文採録決定
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged IEICE, Journal
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(日本語) 英文論文誌 IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文掲載
对不起,此内容只适用于日本語。
Posted in Publication
Tagged IEICE, Journal
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