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February 2025 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 Archives
Tag Archives: Journal
Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading
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Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
We are pleased to announce that the following two papers have been accepted for publication in Japanese Journal of Applied Physics (JJAP). Oshima’s paper is a joint work with AIST. Kyohei Shimozato, Yohei Nakamura, Song Bian, and Takashi Sato, “An … Continue reading
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Tagged compact model, Journal, JSAP, organic circuit, power device, reliability
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Paper accepted for publication in Japanese Journal of Applied Physics
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work has been done in collaboration with AIST. Zhaoxing Qin, Song Bian, Kazunori Kuribara and Takashi Sato: “Stable organic SRAM cell with p-type access … Continue reading
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Tagged Journal, JSAP, organic circuit, SRAM
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IEEE Transactions on Semiconductor Manufacturing: paper accepted
The following paper has been accepted for publication in the journal IEEE Transactions on Semiconductor Manufacturing. Organic thin-film transistors (OTFTs) have advantages such as low cost manufacturing on flexible substrates. Meanwhile, it is known that their characteristics are degraded when … Continue reading
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Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
Sorry, this entry is only available in 日本語.
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Tagged IEEE, Journal, puf, security
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
The following paper has been accepted for publication in IEEE Transactions on Semiconductor Manufacturing. Power MOSFETs play an important role in power converters as high-performance switching devices. Variation-aware circuit simulation is now considered indispensable to improve the reliability of such … Continue reading
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Tagged device model, IEEE, Journal, power electronics
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Japanese Journal of Applied Physics: paper accepted
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This work was done in collaboration with AIST. Kunihiro Oshima, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Recovery-aware bias-stress degradation model for organic … Continue reading
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Tagged device model, Journal, JSAP, organic, reliability
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A journal paper accepted for JJAP
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is a joint work with National Institute of Advanced Industrial Science. Yasuhiro Ogasahara, Kazunori Kuribara, Michihiro Shintani, and Takashi Sato: “Feasibility of a low-power, … Continue reading
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Tagged Journal, organic, puf
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A paper accepted for publication in IEICE journal
The following paper has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. Song Bian, Masayuki Hiromoto, and Takashi Sato: “Hardware-Accelerated Secured Naive Bayesian Filter Based on Partially Homomorphic Encryption,” IEICE Transactions on Fundamentals … Continue reading
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Tagged IEICE, Journal
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(日本語) 英文論文誌 IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciencesへの論文掲載
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Tagged IEICE, Journal
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