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October 2024 M T W T F S S « Apr 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 Archives
Tag Archives: IEEE
Oshima received the IEEE CEDA All Japan Joint Chapter Academic Research Award
Posted in Award
Tagged academic research award, CEDA, IEEE
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IEEE Kansai Chapter MFSK Award
Posted in Award
Tagged device model, electron device society, IEEE, organic
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IEEE Transactions on Semiconductor Manufacturing: paper accepted
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged device model, IEEE, Journal, organic
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IEEE Sensors Jornal, paper accepted
对不起,此内容只适用于日本語。
Posted in Publication
Tagged IEEE, Journal, puf, security
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A paper has been accepted for publication in IEEE Transactions on Information Forensics & Security
对不起,此内容只适用于English和日本語。
Posted in Publication
Tagged IEEE, security, TIFS
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A paper accepted for publication in IEEE Transactions on Semiconductor Manufacturing
Hiroki Tsukamoto, Michihiro Shintani and Takashi Sato: “Statistical Extraction of Normally and Lognormally Distributed Model Parameters for Power MOSFETs,” IEEE Transactions on Semiconductor Manufacturing, (to appear). DOI: 10.1109/TSM.2020.2975300
Posted in Publication
Tagged device model, IEEE, Journal, power electronics
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DAC2020: paper accepted
对不起,此内容只适用于English和日本語。
Posted in Conference/Workshop
Tagged ACM, DAC, IEEE, novel computing
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(日本語) ASPDAC2020
A master course student, Yuki Kume, made a presentation in ASPDAC2020 held at China National Convention Center, Beijing, China. Echo State Network (ESN), which is a kind of recurrent neural network (RNN), has recently attracted many attentions. The weights of … Continue reading
Posted in Conference/Workshop
Tagged ACM, ASP-DAC, IEEE, novel computation
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