Tag Archives: device modeling

Paper accepted: EPE2022

Posted on Wednesday May 25th, 2022 by ts

The following paper has been accepted for presentation at the EPE 2022 ECCE Europe conference (EPE) 2022, an international conference related to power electronics to be held in September 2022. This is the result of joint research with Nara Institute … Continue reading →

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Paper accepted for presentation in IRPS2022

Posted on Thursday February 3rd, 2022 by ts

The following paper has been accepted for presentation in IRPS2022 (IEEE International Reliability Physics Symposium 2022)． Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), … Continue reading →

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Paper accepted: APEC2022

Posted on Friday January 7th, 2022 by ts

Sorry, this entry is only available in 日本語.

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