Tag Archives: device aging

Paper accepted: JJAP

Posted on Friday January 13th, 2023 by ts

The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science. Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato, “Aging-robust amplifier composed … Continue reading →

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Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Posted on Thursday February 10th, 2022 by ts

The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading →

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