Tag Archives: DAC

DAC2020

Dan, a graduate of our group presented his research at the 57th ACM/IEEE Design Automation Conference (DAC) 2020 held from July 20 to July 24, 2020 (presentation date: July 25). In addition to DAC being the top conference in integrated … Continue reading

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DAC2020: paper accepted

The following paper has been accepted for presentation in Design Automation Conference 2020. The paper presentation from our group in the DAC conference is five years in a row. Akira Dan, Riu Shimizu, Takeshi Nishikawa, Song Bian and Takashi Sato, … Continue reading

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DAC2019

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Our paper has been accepted for presentation in DAC2019 Las Vegas!

The following paper has been accepted for presentation in DAC2019(ACM/IEEE Design Automation Conference 2019) (acceptance rate 24.8%=202/815). Conguratulations!! Song Bian, Masayuki Hiromoto, and Takashi Sato, “Filianore: Better multiplier architectures for LWE-based post-quantum key exchange,” in Proc. ACM/IEEE Design Automation Conference … Continue reading

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(日本語) DAC2018

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A paper presented at DAC2017

Mr. Song Bian presented his paper in Design Automation Conference (DAC) 2017 held in Austin, Tx. Song’s presentation was on creating learning-based STA libraries for characterizing aging-induced device variations. Traditional approach to the accurate characterization of aging (specifically negative bias … Continue reading

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Student paper accepted for presentation in DAC 2017

The following paper has been accepted for presentation in DAC 2017 (ACM/IEEE Design Automation Conference). Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato: “LSTA: Learning-Based Static Timing Analysis for High-Dimensional Correlated On-Chip Variations,” in Proc. of ACM/IEEE Design Automation … Continue reading

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Article on our DAC2016 paper

Nikkei BP online now uploaded a tutorial article on our DAC2016 paper.

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A paper presented at DAC2016

Dr. Awano presented a paper in Design Automation Conference (DAC) 2016 held in Austin, Tx. His talk is about the accelerated calculation of timing yield of logic circuits. By introducing the idea of Line sampling to the timing analysis, simulations … Continue reading

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Student paper accepted for presentation in DAC 2016

The following paper has been accepted for presentation in DAC 2016 (ACM/IEEE Design Automation Conference). Hiromitsu Awano and Takashi Sato, “Efficient Transistor-level Timing Yield Estimation via Line Sampling,” ACM/IEEE Design Automation Conference (DAC), accepted for presentation, Jun 2016. (Austin, TX)

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