Paper accepted: JJAP

The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.

  • Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato, “Measurement of 64 organic thin-film transistors in an array test structure using relay-switch board for efficient evaluation of long-term reliability,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acae2d
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