The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science.
- Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato, “Measurement of 64 organic thin-film transistors in an array test structure using relay-switch board for efficient evaluation of long-term reliability,” Japanese Journal of Applied Physics (JJAP), accepted for publication. doi: 10.35848/1347-4065/acae2d