On November 11 and 12, 2021, Prof. Sato gave the following invited talk on statistical circuit simulation at a workshop jointly organized by the Silicon Materials and Devices (SDM) Society of the Institute of Electronics, Information and Communication Engineers (IEICE) and the Silicon Technology Section of the Japan Society of Applied Physics.
- Takashi Sato, Hiroki Tsukamoto, Song Bian, and Michihiro Shintani, “Non-normal model parameter generation for variation-aware circuit simulation (invited),” IEICE Technical report, SDM2021-54, vol. 121, no. 235, pp.7-12, November 2021.