The following two papers have been accepted for presentation at the 34th IEEE International Conference on Microelectronic Test Structures (ICMTS) 2022.
- Kyohei Shimozato and Takashi Sato, “dGPLVM: A nonparametric device model for statistical circuit simulation,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2022. (accepted for presentation)
- Kunihiro Oshima, Kazunori Kuribara, and Takashi Sato, “Investigation of layout-dependent characteristic change for improving performance of organic thin-film transistors,” in Proc. IEEE International Conference on Microelectronic Test Structures (ICMTS), March 2022. (accepted for presentation)