The following paper has been accepted as an oral presentation in International Conference on Solid State Devices and Materials (SSDM) 2019.
- Kunihiro Oshima, Michiaki Saito, Michihiro Shintani, Kazunori Kuribara, Yasuhiro Ogasahara, and Takashi Sato, “Experimental study of bias stress degradation of organic thin film transistors,” in Proc. International Conference on Solid State Devices and Materials (SSDM), (Nagoya, Japan) Sep. 2019. (to appear)