以下の論文が国際会議 ISQED 2018 (International Symposium on Quality Electronic Design) に採択されました.

  • Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
    “A Study on NBTI-Induced Delay Degradation Considering Stress Frequency Dependence,” in Proc. of International Symposium on Quality Electronic Design (ISQED) (Santa Clara, CA), Mar. 2018 (to appear).
カテゴリー: Conference/Workshop, Publication タグ: パーマリンク