The following paper has been accepted for presentation in ISQED 2018 (International Symposium on Quality Electronic Design).
- Zuitoku Shin, Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
“A Study on NBTI-Induced Delay Degradation Considering Stress Frequency Dependence,” in Proc. of International Symposium on Quality Electronic Design (ISQED) (Santa Clara, CA), Mar. 2018 (to appear).