Following paper written by M1 student has been accepted for publication in IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.
- Shumpei Morita, Song Bian, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
“Utilization of Path-Clustering in Efficient Stress-Control Gate Replacement for NBTI Mitigation,” IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, July 2017 (to appear).