The following paper has been accepted for publication in IEEE Transactions on Very Large Scale Integration Systems (TVLSI).
- Hiromitsu Awano, Shumpei Morita, and Takashi Sato:
“Scalable device array for statistical characterization of BTI-related parameters,”
IEEE Transactions on Very Large Scale Integration (VLSI) Systems,
DOI: 10.1109/TVLSI.2016.2638021