The following paper has been accepted for presentation in ICMTS 2017 (International Conference on Microelectronic Test Structures).
- Kazuki Oishi, Michihiro Shintani, Masayuki Hiromoto, and Takashi Sato:
“Input Capacitance Determination of Power MOSFETs from Switching Trajectories,” in Proc. of International Conference on Microelectronic Test Structures (ICMTS) (Grenoble, France), Mar. 2017 (to appear).