The following paper has been accepted for presentation in ASP-DAC 2017 (Asia and South Pacific Design Automation Conference). Acceptance rate 31%=111/358.
- Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato:
“Efficient Circuit Failure Probability Calculation Along Product Lifetime Considering Device Aging,” 22nd Asia and South Pacific Design Automation Conference (ASP-DAC 2017) (Chiba/Tokyo, Japan), Jan. 2017 (to appear).