The following paper has been accepted for presentation in ISQED 2016.
- Song Bian, Michihiro Shintani, Shumpei Morita, Masayuki Hiromoto, and Takashi Sato:
“Nonlinear Delay-Table Approach for Full-Chip NBTI Degradation Prediction,” in Proc. of International Symposium on Quality Electronic Design (ISQED) (Santa Clara, CA), Mar. 2016 (to appear).