2015年2月10日(火)の2015年IEEE関西支部総会にてIEEE関西支部学生研究奨励賞授賞が行われ，本研究室の新谷，今川，粟野が表彰されました．
受賞対象の論文および国際会議発表は以下の通りです．
- Michihiro Shintani, Takumi Uezono, Tomoyuki Takahashi, Kazumi Hatayama, Takashi Aikyo, Kazuya Masu, and Takashi Sato, “A Variability-Aware Adaptive Test Flow for Test Quality Improvement,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, Vol.33, No.7, pp.1056-1066, July 2014.
- Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “A Cost-Effective Selective TMR for Heterogeneous Coarse-Grained Reconfigurable Architectures Based on DFG-Level Vulnerability Analysis,” in Proceedings of Design, Automation and Test in Europe (DATE) (Grenoble, France), Mar. 2013.
- Hiromitsu Awano, Masayuki Hiromoto, and Takashi Sato, “BTIarray: a Time-Overlapping Transistor Array for Efficient Statistical Characterization of Bias Temperature Instability,” IEEE Transactions on Device and Materials Reliability, Vol.14, No.3, pp.833-843, Sep. 2014.
