Prof. Sato gave a talk in ASICON 2013, which is held on Oct.28-31, 2013, in Shenzhen, China.

Takashi Sato, “Statistical simulation methods for analyzing performance of low supply voltage circuits (invited),” in Proc. IEEE 10th International Conference on ASIC (ASICON), pp.103-106, September, 2013. (Best Western Shenzhen Felicity Hotel, Shenzhen, China)

This paper reviews statistical simulation methods that can efficiently and accurately handle device parameter variability. Technical discussions with Chinese professors were very fruitful. A visit to Shenzhen’s famous electronic markets around Huaqiangbei Road was really stimulating.

This entry was posted in Conference/Workshop and tagged , . Bookmark the permalink.