2013年3月4日~6日,International Symposium on Quality Electronic Design (ISQED) 2013在美国加利福尼亚州圣克拉拉市举行,本研究室今川和粟野学长做了自己的研究发表。
- Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato: “High-Speed DFG-Level SEU Vulnerability Analysis for Applying Selective TMR to Resource-Constrained CGRA,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), March 2013.
- Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato: “Multi-Trap RTN Parameter Extraction Based on Bayesian Inference,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara,CA), March 2013.
同时,在转换学会会场的途中,两位学长在百忙之中参观了加利福尼亚大学伯克利分校,计算机历史博物馆等设施,并给他们留下了深刻的印象。