以下2篇论文将刊登在ISQED2013（2013年3月）
- Hiromitsu Awano, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “Multi-Trap RTN Parameter Extraction Based on Bayesian Inference,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), Mar. 2013 (to appear).
- Takashi Imagawa, Hiroshi Tsutsui, Hiroyuki Ochi, and Takashi Sato, “High-Speed DFG-Level SEU Vulnerability Analysis for Applying Selective TMR to Resource-Constrained CGRA,” International Symposium on Quality Electrical Design (ISQED) (Santa Clara, CA), Mar. 2013 (to appear).