On November 8th, Prof. Sato presented the following work (poster presentation) at VMC2012 (IEEE/ACM Workshop on Variability Modeling and Characterization 2012), which was held in San Jose, CA.
- Michihiro Shintani and Takashi Sato, “Adaptive Current-Threshold Determination for Accurate IDDQ Testing,” IEEE/ACM Workshop on Variability Modeling and Characterization (VMC2012), November 2012.
