Daily Archives: Tuesday April 25th, 2023

Paper accepted: FLEPS2023

Posted on Tuesday April 25th, 2023 by ts

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ICMTS 2023

Posted on Tuesday April 25th, 2023 by ts

Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023. K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling … Continue reading →

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SCIS2023

Posted on Tuesday April 25th, 2023 by ts

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