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Yearly Archives: 2023
Paper accepted: FLEPS2023
Sorry, this entry is only available in 日本語.
Posted in Conference/Workshop
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ICMTS 2023
Niiyama-kun (M1) presented his research at International Conference on Microelectronic Test Structures (ICMTS 2023) held at the University of Tokyo from March 27 to 30, 2023. K. Niiyama, H. Awano, and T. Sato, “Introducing transfer learning framework on device modeling … Continue reading
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SCIS2023
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(日本語) MICT研究会
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Posted in Conference/Workshop
Tagged packet capture, posture estimation, vital sensing
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Paper accepted: JJAP
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science. Yuto Kaneiwa, Kazunori Kuribara, and Takashi Sato, “Aging-robust amplifier composed … Continue reading
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Tagged amplifier design, device aging, organic circuit
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Paper accepted: JJAP
The following paper has been accepted for publication in Japanese Journal of Applied Physics (JJAP). This is an outcome of the joint work with National Institute of Advanced Industrial Science. Yasuhiro Ogasahara, Kazunori Kuribara, and Takashi Sato, “Measurement of 64 … Continue reading
Posted in Publication
Tagged device characterization, organic transistors, reliability
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