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Daily Archives: Monday February 21st, 2022
Two papers accepted for presentation in ICMTS 2022
The following two papers have been accepted for presentation at the 34th IEEE International Conference on Microelectronic Test Structures (ICMTS) 2022. Kyohei Shimozato and Takashi Sato, “dGPLVM: A nonparametric device model for statistical circuit simulation,” in Proc. IEEE International Conference … Continue reading
Posted in Conference/Workshop
Tagged Bayesian model, device model, IEEE, organic circuit
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