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Daily Archives: Thursday February 10th, 2022
Paper accepted: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
The following paper has been accepted for publication in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD). This paper is a summary of the research results developed by a former student of our laboratory, who further extended … Continue reading
Posted in Publication
Tagged device aging, IEEE, Journal, lifetime estimation, Monte Carlo simulation, reliability
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