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Daily Archives: Thursday February 3rd, 2022
Paper accepted for presentation in IRPS2022
The following paper has been accepted for presentation in IRPS2022 (IEEE International Reliability Physics Symposium 2022)． Masato Shiozaki and Takashi Sato, “Characteristic degradation of power MOSFETs by X-ray irradiation and its recovery,” in Proc. IEEE International Reliability Physics Symposium (IRPS), … Continue reading
Posted in Conference/Workshop
Tagged device modeling, power device, X-ray irradiation
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